30. Juni 2023
Analog testing plays a crucial role in various semiconductor test applications. It finds extensive application in sensing, imaging, and even in 2.5D and 3D integration.
Analog interfaces naturally offer high information bandwidth on a single data path. At aSpect, we specialize in supporting intense analog testing with our capability to handle deep parallel scans using our tester controllers, which provide an impressive system bandwidth up to the RAM (e.g. aggregated 400Gbps into 256GB).
Our solutions cater to diverse requirements, and the attached image showcases one such example. It features a unit equipped with four Analog Device 16-channel ADCs (AD9249), our FPGA module (aS_PCB_Kintex7), and Samtec FIREFLY optical link. Noteworthy properties of these ADCs include 14-bit resolution, 65MS/s sampling rate, and a 2Vp-p input voltage range. With a signal-to-noise ratio (SNR) of 75 dBFS (to Nyquist) and a spurious-free dynamic range (SFDR) of 90 dBc (to Nyquist), they offer exceptional performance.
To simplify data processing, we transmit a two-byte word for each 14-bit sample, resulting in an aggregated output bandwidth of 67 Gbps for 64 channels when sampled at 65MS/s. This data can be seamlessly streamed using the optical link. In one wafer test application, we employ eight of these units, giving us a total of 512 ADC channels.
At aSpect, we are dedicated to providing cutting-edge solutions and custom implementations for analog testing, enabling our clients to achieve optimal performance and efficiency in their semiconductor testing processes.