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Latest News

27. März 2024

Specialisation and Innovation is imanent in Silicon Saxony

aSpect Systems supports high resolution wafer AOI to semiconductor industry

Specialisation and Innovation is imanent in Silicon Saxony

19. Okt. 2023

Custom Automation Equipment

One platform for many applications

Custom Automation Equipment

9. Okt. 2023

Flandern Semiconductors

Exciting News! aSpect Systems Joins Flanders Semiconductors.

Flandern Semiconductors

20. Sept. 2023

COB: Customized Packaging

Elevating CMOS Image Sensor Packaging with our COB Expertise

COB: Customized Packaging

30. Juni 2023

One More: The aS_PCB_Kintex7 - with Analog Front End!

Analog testing plays a crucial role in various semiconductor test applications. It finds extensive application in sensing, imaging, and even in 2.5D and 3D integration.

One More: The aS_PCB_Kintex7 - with Analog Front End!

27. Juni 2023

Unique Test Engineering Concept

At aSpect, we take immense pride in our cutting-edge approach to semiconductor testing. Unlike other OSATs or test houses, we believe in collaborating closely with our clients to determine the most efficient and effective way to realize a wafer- or final test setup. Today, I'm thrilled to share with you our unique test engineering concept that sets us apart from the competition.

Unique Test Engineering Concept

16. Juni 2023

Optical interface for the aS-PCB-Kintex7

These days we test devices transmitting more than 1Tbps which would require 100 of our CL interfaces. There are several different ways to deal with this bandwidth range and we also use different type of interfaces. But one very nice and compact approach is Samtec Firefly.

Optical interface for the  aS-PCB-Kintex7

8. Juni 2023

Introducing the aS-PCB-Kintex7

Are you searching for the ultimate PCB module to drive your company's FPGA projects to new heights? Look no further than the aS-PCB-Kintex7 from aSpect Systems. Unleash the Power of Xilinx Kintex7 FPGAs.

Introducing the aS-PCB-Kintex7

31. Mai 2023

Multi Site Illumination

Optimize Your Test Application for Image Sensors with aSpect's Illumination Solutions

Multi Site Illumination

25. Mai 2023

Particles on Image Sensors

Particles in the package cavity can reduce the yield for high end sensors significantly. Prevent to overreject if particles can be cleaned.

Particles on Image Sensors

10. Mai 2023

Prototyping for your Innovations

Are you looking to shorten your NPI development cycle?

Prototyping for your Innovations

3. Mai 2023

Outsourced Semiconductor Assembly and Test (OSAT)

We provide a full service for Assembly and Test and the complete supply chain

Outsourced Semiconductor Assembly and Test (OSAT)

25. Apr. 2023

Wafer Test Solutions for Optoelectronics

Wafer Test Solutions for µDisplay with integrated Image Sensor + AOI

Wafer Test Solutions for  Optoelectronics

21. Apr. 2023

LWIR Slanted Edge Illuminator

MTF Measurement for LWIR Camera

LWIR Slanted Edge Illuminator

1. Juni 2020

Ultrasonic MEMS Testing

Innovation at it’s best in cooperation with the Fraunhofer IPMS funded by the Sächsische Aufbaubank located in Silicon Saxony

Ultrasonic MEMS Testing

13. Jan. 2020

ISO 9001:2015

ISO 9001:2015

18. Nov. 2019

Bandwidth AND deep memory?

Bandwidth AND deep memory?

15. Juli 2019

CNC Machinery

We support this manufacturing also as a service. Please contact us if you need mechanical components (info@aspect-sys.com).

CNC Machinery

1. Juni 2017

Quick Prototyping and Manufacturing

Quick Prototyping and Manufacturing

5. Mai 2017

STDF result file format for idMATE

Good news from aSpect Systems wafer test department,

STDF result file format for idMATE
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