25. Apr. 2023
Wafer Test Solutions for µDisplay with integrated Image Sensor + AOI
We support wafer test solutions for CMOS Image Sensors (CIS) and µDisplays.
This test setup example is for a unique µDisplay with integrated image sensor. Beside of the test capabilities to measure the display and sensor parameter it supports also automated optical inspection (AOI).
We delivery such test setups as turn-key solution and/or us it for test services.