5. Mai 2017
Good news from aSpect Systems wafer test department,
For now on we enlarge our report data format in idMATE to support STDF file format (“Standard Test Data Format”, developed by Teradyne Inc., binary record stream). STDF is common used in most wafer fabs . With this “quasi Standard” it becomes easy to track and analyze all your ATE (Automatic Test Equipment) results from FAB to wafer test and final test step by step. Depending on the customer’s requirements, aSpect Systems provides the test data records for a complete wafer LOT or for each wafer individually. For further Information please contact us and we will discuss your needs and how we can help.